XRD AND SEM-EDS ANALYSES OF STARCH OBTAINED FROM WHITE CORN SEEDS
Abstract
This study investigates the structural and elemental composition of starch extracted from white
corn seeds using X-ray diffraction (XRD) and scanning electron microscopy coupled with
energy-dispersive X-ray spectroscopy (SEM-EDS). XRD analysis was employed to determine
the crystalline structure of the starch granules, revealing a typical A-type pattern indicative of
cereal starches, characterized by strong diffraction peaks at angle 2θ of 15°, 17°, 18°, and
23°.The crystallinity index was calculated, demonstrating the semi-crystalline nature of the
starch. SEM provided detailed morphological insights, showing smooth, polyhedral granules
with sizes ranging from 5 to 20 micrometers. The EDS analysis complemented these findings by
identifying the elemental composition, confirming the presence of essential elements such as
carbon, oxygen, and minor traces of phosphorus and potassium, which are intrinsic to starch
molecules. This comprehensive characterization enhances our understanding of white corn
starch's structural properties and its potential applications in food, pharmaceuticals, and bio-
degradable materials
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